XRD: X-ray Diffraction

X-ray diffraction (XRD) is a technique based on the elastic scattering of x-rays from the atomic arrangement within a sample. This technique provides information on the structural atomic arrangement of a solid, powder or thin film sample.

When not in use by faculty or students, it can be reserved for use. The device is available to rent per hour. Please contact the department for scheduling.

Contact: Dr. Robert Mayanovic


Kemper Hall 101E, 417-836-5606