Field-Emission Scanning Electron Microscope

The SEM provides high resolution secondary electron and backscattered electron images of surface topography, spatial elemental distribution, and internal structures for conductive as well as nonconductive materials. The instrument is used in general to conduct fundamental and applied research as well as for training undergraduate and graduate students. In particular, the instrument is used to explore correlations between morphology, structures, and compositions of various nanomaterials and their electrical, optical, magnetic, and biological properties.

When not in use by faculty or students, it can be reserved for use. Click here to rent per hour. Please contact the department for scheduling.

Contact: Dr. David Cornelison, Department Head

Kemper Hall 101A, 417-836-4467